Colloid-sensor For Afm

Abstract

The invention comprises a sensor (10), for use in an atomic force microscope, with a cantilever (20) having at least one detection tip (30) and a detection probe (40). The detection probe (40) is attached to the at least one detection tip (30) and has a detection tip contact surface (32) shaped to substantially mate to at least a portion of the detection probe (40). The invention also provides a method for the manufacture of a sensor in which a cantilever (20) with at least one detection tip (30) is truncated such that the at least one detection tip (30) has a detection tip contact surface (32) shaped to substantially mate to at least a portion of the detection probe (40). Finally the detection probe (40) is attached to the substantially mating detection tip contact surface (32).


Claims
Download PDF
Document Preview
Document History
  • Publication: Apr 9, 2009
  • Application: Dec 6, 2007
    WO EP 2007010596 W
  • Priority: Oct 1, 2007
    GB GB 0719108 A

Sign in to the Lens

Release 5.10.0: Improved patent search performance, saved query alerts, increased user privacy and more!

Improved Search Performance

Upgraded patent search index servers to improve search performance.

Saved Query Alerts.

Improvements to in saved query alerts emails and better formatting of links.

Increased User Privacy.

Removed Google Maps dependency in a Patents Family page.