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PROBLEM TO BE SOLVED: To provide a testing device, method and program for an exchange controller that can adapt to TCP/IP, decrease the amount of operations for adaptation to different kind of exchanges, adapt to use of a redundancy system and a file transfer protocol, and reduce generating operations for data etc.
SOLUTION: In a testing device for the exchange controller that tests operations of an exchange controller controlling a plurality of different kind of exchanges as a dummy exchange, a testing device for the exchange controller includes a network connection means of making connections with the exchange controller by a common communication protocol, a protocol control means of performing unique protocol control corresponding to the kind of a different kind of exchange for each of kinds of different kind of exchanges, and a scenario control means of performing answering processing on a command from the exchange controller regardless of the kind of the different kind of exchange.
COPYRIGHT: (C)2009,JPO&INPIT","lang":"en","source":"DOCDB_PAJ","data_format":"DOCDBA"}]},"abstract_lang":["en"],"has_abstract":true,"claim":{},"has_claim":false,"description":{},"description_lang":[],"has_description":false,"has_docdb":true,"has_inpadoc":false,"has_full_text":false},"jurisdiction":"JP","collections":[],"usersTags":[],"lensId":"170-766-704-124-399","publicationKey":"JP_2009081566_A","displayKey":"JP 2009081566 A","docAssets":{"lensId":"170-766-704-124-399","images":[],"fallover":false},"countryName":"JAPAN","inventorModel":{"inventors":[{"name":{"value":"MIYAMOTO YUKIO","valueNormalised":"Miyamoto Yukio"},"inventorship":null},{"name":{"value":"NAKANO KENJI","valueNormalised":"Nakano Kenji"},"inventorship":null},{"name":{"value":"FUKUSHIMA KENICHIRO","valueNormalised":"Fukushima Kenichiro"},"inventorship":null},{"name":{"value":"KAWASAKI YUJI","valueNormalised":"Kawasaki Yuji"},"inventorship":null},{"name":{"value":"TAKAHASHI TERUHISA","valueNormalised":"Takahashi Teruhisa"},"inventorship":null},{"name":{"value":"BABA ATSUSHI","valueNormalised":"Baba Atsushi"},"inventorship":null}],"inventorships":[],"unmatchedInventorships":[],"activeUserHasInventorship":false},"simpleFamilyId":99598772,"citesPatentCount":0,"countrySpec":{"countryName":"JAPAN","description":"DOC. LAID OPEN TO PUBL. INSPEC. [PUBLISHED FROM 1971 ONWARDS]","rule":"pubdate:AFTER:16-07-1971","docType":"PATENT_APPLICATION"},"pageTitle":"JP 2009081566 A - Testing Device, Method And Program For Exchange Controller","documentTitle":"Testing Device, Method And Program For Exchange Controller"}},"filters":{"npl":[],"notNpl":[],"applicant":[],"notApplicant":[],"inventor":[],"notInventor":[],"owner":[],"notOwner":[],"tags":[],"dates":[],"types":[],"notTypes":[],"j":[],"notJ":[],"fj":[],"notFj":[],"classIpcr":[],"notClassIpcr":[],"classNat":[],"notClassNat":[],"classCpc":[],"notClassCpc":[],"so":[],"notSo":[],"sat":[]},"sequenceFilters":{"s":"SEQIDNO","d":"ASCENDING","p":0,"n":10,"sp":[],"si":[],"len":[],"t":[],"loc":[]}}