Cantilever Sensor For Atomic Force Microscopes

  • Published: Apr 15, 2009
  • Family: 3
  • Cited Works: 0
  • Cited by: 1
  • Cites: 7
  • Additional Info: Published
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Abstract

The invention comprises a sensor for use in an atomic force microscope, with a cantilever (20) having at least one detection tip (30) and a detection probe (40). The detection probe (40) is attached to the at least one detection tip (30) and has a detection tip contact surface (32) shaped to substantially mate to at least a portion of the detection probe (40). The invention also provides a method for the manufacture of a sensor in which a cantilever (20) with at least one detection tip (30) is truncated such that the at least one detection tip (30) has a detection tip contact surface (32) shaped to substantially mate to at least a portion of the detection probe (40). Finally the detection probe (40) is attached to the substantially mating detection tip contact surface (32).


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Document History
  • Publication: Apr 15, 2009
  • Application: Oct 1, 2007
    GB GB 0719108 A
  • Priority: Oct 1, 2007
    GB GB 0719108 A

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