Method For Measuring The Force Interaction That Is Caused By A Sample

Abstract

Disclosed is a method for measuring the force interaction caused by a sample, wherein a bias voltage, with respect to the sample, is applied between a tip, and the tip is guided at such a small distance to the sample that a measurable current flows between the tip and the sample, and a sensor and signal converter S, which changes the current flowing through the tip-sample contact depending on the intensity of the force interaction, is formed and used in the region of the force interaction. A scanning tunneling microscope therefor is disclosed.


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Document History
  • Publication: Sep 9, 2014
  • Application: Aug 27, 2010
    US US 201013390623 A
  • Priority: Aug 27, 2010
    DE DE 2010001004 W
  • Priority: Sep 3, 2009
    DE DE 102009039840 A

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