Transformer Within Wafer Test Probe

  • Published: Oct 27, 2011
  • Earliest Priority: Dec 08 2009
  • Family: 6
  • Cited Works: 0
  • Cited by: 0
  • Cites: 12
  • Additional Info: Full text
Abstract

A wafer test probe (312) for testing integrated circuitry (320) on a die (318) is disclosed. The wafer test probe includes a membrane core (314). The wafer test probe also includes circuitry (316) within the membrane core. The circuitry within the membrane core includes at least one portion of an inductor. The wafer test probe further includes a probe tip.


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Document History
  • Publication: Oct 27, 2011
  • Application: Dec 8, 2010
    WO US 2010/0059570 W
  • Priority: Dec 8, 2009
    US US 63287309 A

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