Wafer Probe

Abstract

The present invention relates to a probe for testing of integrated circuits or other microelectronic devices.


Claims
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Document History
  • Publication: Feb 24, 2009
  • Application: Oct 18, 2007
    US US 97517607 A
  • Priority: Oct 18, 2007
    US US 97517607 A
  • Priority: Apr 26, 2007
    US US 79623707 A
  • Priority: Nov 19, 2001
    US US 99750101 A
  • Priority: Dec 4, 2000
    US US 25118600 P

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